A factoring method to calculate reliability for systems of dependent componentsYUAN, J; KAI-LI KO.Reliability engineering & systems safety. 1988, Vol 21, Num 2, pp 107-118, issn 0951-8320Article

Empirically based analysis of failures in software systemsSELBY, R. W.IEEE transactions on reliability. 1990, Vol 39, Num 4, pp 444-454, issn 0018-9529Article

On the reliability function of a system of components sharing a common environmentCURRIT, A; SINGPURWALLA, N. D.Journal of applied probability. 1988, Vol 25, Num 4, pp 763-771, issn 0021-9002Article

Functions of elementary random variables and their application to system reliabilitySTÖRMER, H.Zeitschrift für Operations Research. 1987, Vol 31, Num 5, pp A173-A188, issn 0373-790XArticle

RAPID: Recursive Algorithmic PI VOTAL Decomposition program for complex structural reliability analysisPARK, K. S; CHO, B. C.IEEE transactions on reliability. 1988, Vol 37, Num 1, pp 50-53, issn 0018-9529Article

Some open questions on : strict consecutive-k-out-of-n:F systemsRUSHDI, A. M.IEEE transactions on reliability. 1990, Vol 39, Num 3, pp 380-381, issn 0018-9529, 2 p.Article

A suggestion of a new measure of system components importance by means of a Boolean differenceRYABININ, I. A.Microelectronics and reliability. 1994, Vol 34, Num 4, pp 603-613, issn 0026-2714Article

A note on a paper by Gupta and KumarMANNA, D. K.Microelectronics and reliability. 1992, Vol 32, Num 5, pp 733-735, issn 0026-2714Article

When is greedy module assembly optimal?MALON, D. M.Naval research logistics. 1990, Vol 37, Num 6, pp 847-854, issn 0894-069XArticle

Graphical analysis of system repair dataNELSON, W.Journal of quality technology. 1988, Vol 20, Num 1, issn 0022-4065, 24-35L 11 repArticle

On the correlation between inter-arrival delays of shocksSUDDHENDU BISWAS; VIJAY KUMAR SEHGAL.Microelectronics and reliability. 1988, Vol 28, Num 2, pp 189-192, issn 0026-2714Article

Bayesian analysis of learning in risk analysesHORA, S. C; IMAN, R. L.Technometrics. 1987, Vol 29, Num 2, pp 221-229, issn 0040-1706Article

Closed-form solution for system availability distributionDONATIELLO, L; IYER, B. R.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 45-47, issn 0018-9529Article

A sequence of diagnosis and repair for a 2-state repairable systemQIN ZHANG.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 32-33, issn 0018-9529Article

Errors in availability estimation by 2-state models of 3-state systemsWATANABE, Y.Reliability engineering. 1987, Vol 18, Num 3, pp 223-235, issn 0143-8174Article

A simulation approach for computing systems reliabilityALIDRISI, M. M.Microelectronics and reliability. 1987, Vol 27, Num 3, pp 463-467, issn 0026-2714Article

Pivotal decomposition to find availability and failure-frequency of systems with common-cause failuresYUAN, J.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 48-53, issn 0018-9529Article

Reliability measures for a regenerative system viewed over a random horizonWELLS, C. E.IEEE transactions on reliability. 1987, Vol 36, Num 1, pp 124-128, issn 0018-9529Article

Calculation of critical importance for multi-state componentsBOSSCHE, A.IEEE transactions on reliability. 1987, Vol 36, Num 2, pp 247-249, issn 0018-9529Article

Reliability-based life cycle costingNTUEN, C. A.Microelectronics and reliability. 1987, Vol 27, Num 5, pp 833-834, issn 0026-2714Article

Availability measures for various multi-unit systemsKAPUR, P. K; BUTANI, N. L.Microelectronics and reliability. 1986, Vol 26, Num 6, pp 1089-1097, issn 0026-2714Article

Eigenvalue-eigenvector solutions for two general Markov models in reliabilityJOHNSON, L. E.Microelectronics and reliability. 1986, Vol 26, Num 5, pp 917-933, issn 0026-2714Article

Open & short circuit reliability of systems of identical itemsJENNEY, B. W; SHERWIN, D. J.IEEE transactions on reliability. 1986, Vol 35, Num 5, pp 532-538, issn 0018-9529Article

Stochastic analysis of a two unit priority standby system with two switching devicesGOEL, L. R; SHARMA, S. C.Microelectronics and reliability. 1986, Vol 26, Num 6, pp 1025-1031, issn 0026-2714Article

Utilization of symmetric switching functions in the computation of k-out-of-n system reliabilityRUSHDI, A. M.Microelectronics and reliability. 1986, Vol 26, Num 5, pp 973-987, issn 0026-2714Article